Full-wave rectifier for capacitance measurements

ABSTRACT

One embodiment of the present invention provides an electronic circuit and method for measuring a capacitance. A signal generating mechanism generates a signal having a predefined frequency and predefined low and high voltage levels on one terminal of the capacitance. The other terminal of the capacitance is coupled to a switching mechanism. The switching mechanism is set to couple the other terminal of the capacitance to a first amplifier or a second amplifier for a portion of each signal cycle thereby full-wave rectifying a transient current flowing between the two terminals in the capacitance. Outputs of the first amplifier and the second amplifier are coupled to a current measurement mechanism for measuring the current. The capacitance is determined from the measured current. Several variations on this embodiment are provided.

RELATED APPLICATION

This application hereby claims priority under 35 U.S.C. §119 to U.S.Provisional Patent Application No. 60/505,106 filed on 22 Sep. 2003,entitled “Full-Wave Rectifier for Capacitance Measurements,” byinventors Robert J. Drost, Ronald Ho and Ivan E. Sutherland.

GOVERNMENT LICENSE RIGHTS

This invention was made with United States Government support underContract No. NBCH020055 awarded by the Defense Advanced ResearchProjects Administration. The United States Government has certain rightsin the invention.

BACKGROUND

1. Field of the Invention

The present invention relates to an electronic circuit. Morespecifically, the present invention relates to a full-wave-rectifiercircuit that improves a resolution of on-chip or chip-to-chipcapacitance measurements.

2. Related Art

Advances in semiconductor technology presently make it possible tointegrate large-scale systems, including tens of millions oftransistors, into a single semiconductor chip. Integrating suchlarge-scale systems onto a single semiconductor chip increases the speedat which such systems can operate, because signals between systemcomponents do not have to cross chip boundaries, and are not subject tolengthy chip-to-chip propagation delays. Moreover, integratinglarge-scale systems onto a single semiconductor chip significantlyreduces production costs, because fewer semiconductor chips are requiredto perform a given computational task.

However, these advances in semiconductor technology also pose challengesin intra- and inter-chip communication. Increasing the number oftransistors on a single semiconductor chip requires a reduction in thecritical dimensions of the transistors and the on-chip signal lines.This reduction in the critical dimensions reduces the capacitancesassociated with the transistors and on-chip signal lines. Thesecapacitances are critical to chip performance, especially as the chipspeed increases. Unfortunately, the reduced capacitances areincreasingly difficult to measure. Note that is often necessary tomeasure these capacitances to calibrate the electronic tools used todesign the semiconductor chips and for manufacturing process controlpurposes.

In addition, the reduction in the critical dimension of the on-chipsignal lines is making integration of the semiconductor chips onto aprinted circuit board that contains multiple layers of signal lines forinter-chip communication increasingly difficult, since the signal lineson a semiconductor chip are about 100 times more densely packed thansignal lines on a printed circuit board.

Researchers have begun to investigate alternative techniques forcommunicating between semiconductor chips. One promising techniqueinvolves integrating arrays of capacitive transmitters and receiversonto semiconductor chips to facilitate inter-chip communication bycapacitively coupled communication. Such capacitively coupledcommunication is highly sensitive to inter-chip alignment, which affectscapacitance between the semiconductor chips. In many cases, it is usefulto be able to measure capacitance to determine the semiconductor chipalignment. However, the capacitances are small and difficult to measure.

FIG. 1 illustrates an exemplary electronic circuit 100 for measuringcapacitance. A signal source 108 produces a square wave signal 110(shown in FIG. 2) on a node Vtx 112 that transitions between ground andVdd. A capacitor device under test C_(DUT) 114 couples a charge ofQ=C_(DUT)·Vdd or Q=−C_(DUT)·Vdd onto a node Vrx 116 during rising orfalling transitions, respectively, of node Vtx 112. Switches S₁ 118 andS₂ 120, controlled by Hrect 122 (shown in FIG. 2) and {overscore(Hrect)} 124 (shown in FIG. 2), respectively, connect node Vrx 116 toground 126 or an ammeter 128.

Capacitors 130 and 132 represent parasitic capacitances due to wiringand device parasitics. Note that capacitors 130 and 132 do not corruptthe capacitance measurement. Rather, capacitors 130 and 132 only slowthe signal transitions on nodes Vtx 112 and Vrx 116.

FIG. 2 illustrates signal waveforms as a function of time for electroniccircuit 100. The square wave signal 110 on node Vtx 112 couples positivepulses 134 and negative pulses 136 onto node Vrx 116. The positivepulses 134 and negative pulses 136 on Vrx 116 decay as the charge Q onnode Vrx 116 is drained through switch S₁ 118 or S₂ 120. When Hrect 122is high, switch S₁ 118 conducts current and switch S₂ 120 blockscurrent. In this case, the ammeter 128 drains the charge Q from the nodeVrx 116 and measures a resulting transient current 138. When Hrect 122is low, switch S₁ 118 blocks current and switch S₂ 120 conducts current.Following a negative transition on node Vtx 112, current flows throughswitch S₂ 120 to replenish the charge Q removed from node Vrx 116 by thenegative transition.

This electronic circuit half-wave rectifies each cycle of charge Q,which is drained through the ammeter 128. For the square wave signal 110produced by the signal source 108 with a fundamental frequency f, theaverage current in the ammeter 128 is f·C_(DUT)·Vdd. The capacitance ofthe capacitor device under test C_(DUT) 114 is determined from themeasured average current.

The small capacitances associated with the transistors and on-chipsignal lines on semiconductor chips, and the small capacitances betweensemiconductor chips in capacitively coupled communication, which arediscussed above, give rise to small displacement currents. As discussedabove, it is increasingly difficult to measure these currents withexisting techniques. What is needed is an improved method and anapparatus for measuring capacitance without the problems listed above.

SUMMARY

One embodiment of the present invention provides an electronic circuitand method for measuring a capacitance. A signal generating mechanismgenerates a signal having a predefined frequency and predefined low andhigh voltage levels on one terminal of the capacitance. The otherterminal of the capacitance is coupled to an electrical network with atleast four nodes and four switching mechanisms coupled between pairs ofthese nodes. A first pair of switching mechanisms is set to besubstantially open, thereby substantially blocking current, when asecond pair of switching mechanisms is set to be substantially closed,thereby substantially conducting current. When the first pair ofswitching mechanisms is set to be substantially closed, therebysubstantially conducting current, the second pair of switchingmechanisms is set to be substantially open, thereby substantiallyblocking current. In this way, a current associated with each cycle ofthe signal is full-wave rectified and is measured with a currentmeasurement mechanism coupled between two nodes in the network. Thecapacitance is determined from the measured current. Several variationson this embodiment are provided.

Another embodiment of the present invention provides another electroniccircuit and method for measuring the capacitance. A signal generatingmechanism generates a signal having a predefined frequency andpredefined low and high voltage levels on one terminal of thecapacitance. The other terminal of the capacitance is coupled to aswitching mechanism. The switching mechanism is set to couple the otherterminal of the capacitance to a first amplifier or a second amplifierfor a portion of each signal cycle thereby full-wave rectifying acurrent flowing between the two terminals in the capacitance. Outputs ofthe first amplifier and the second amplifier are coupled to a currentmeasurement mechanism for measuring the current. The capacitance isdetermined from the measured current.

In variations on this embodiment, the signal is a square wave signalhaving a fundamental frequency equal to the predefined frequency, theswitching mechanism is a switch, such as an NMOS transistor, a PMOStransistor or a CMOS switch, and the current measuring mechanism is anammeter or a voltmeter coupled in parallel with an impedance, such as aresistor.

In another variation on this embodiment, the switching mechanism couplesthe other terminal of the capacitance to the first amplifier for apredetermined duration of time that includes when the signal transitionsfrom the low voltage level to the high voltage level, and the switchingmechanism couples the other terminal of the capacitance to the secondamplifier for a predetermined duration of time that includes when thesignal transitions from the high voltage level to the low voltage level.

In another variation on this embodiment, the switching mechanism couplesthe other terminal of the capacitance to the first amplifier for thepredetermined duration of time that includes when the signal transitionsfrom the high voltage level to the low voltage level, and the switchingmechanism couples the other terminal of the capacitance to the secondamplifier for the predetermined duration of time that includes when thesignal transitions from the low voltage level to the high voltage level.

In another variation on this embodiment, the first amplifier is a NMOScurrent mirror with a gain and the second amplifier has a PMOS currentmirror with unity gain as a first stage and a NMOS current mirror withsubstantially the gain as a second stage. In another variation on thisembodiment, the first amplifier is a PMOS current mirror with the gainand the second amplifier has a NMOS current mirror with unity gain as afirst stage and a PMOS current mirror with substantially the gain as asecond stage.

In another variation on this embodiment, the first amplifier is a PMOScurrent mirror with unity gain as a first stage and a NMOS currentmirror with the gain as a second stage and the second amplifier is aNMOS current mirror with substantially the gain. In another variation onthis embodiment, the first amplifier is a NMOS current mirror with unitygain as a first stage and a PMOS current mirror with the gain as asecond stage and the second amplifier is a PMOS current mirror withsubstantially the gain.

In another embodiment, the gain is substantially between 10–100.

In yet another embodiment, a first current biasing mechanism is coupledin parallel with an input of the first amplifier and a second currentbiasing mechanism of opposite polarity to the first current biasingmechanism is coupled in parallel with an input of the second amplifier.The bias current in the first current biasing mechanism and the secondcurrent biasing mechanism may be substantially less than the currentflowing through the capacitance coupled to the switching mechanism.

BRIEF DESCRIPTION OF THE FIGURES

FIG. 1 illustrates a prior art electronic circuit for measuringcapacitance.

FIG. 2 illustrates signal waveforms as a function of time for theelectronic circuit in the prior art.

FIG. 3 illustrates an electronic circuit for measuring capacitance inaccordance with an embodiment of the present invention.

FIG. 4 illustrates signal waveforms as a function of time for electricalcircuits in accordance with an embodiment of the present invention.

FIG. 5 illustrates an electronic circuit for measuring capacitance inaccordance with an embodiment of the present invention.

DETAILED DESCRIPTION

The following description is presented to enable any person skilled inthe art to make and use the invention, and is provided in the context ofa particular application and its requirements. Various modifications tothe disclosed embodiments will be readily apparent to those skilled inthe art, and the general principles defined herein may be applied toother embodiments and applications without departing from the spirit andscope of the present invention. Thus, the present invention is notintended to be limited to the embodiments shown, but is to be accordedthe widest scope consistent with the principles and features disclosedherein.

Full-Wave Rectifier for Capacitance Measurements

FIG. 3 illustrates an electronic circuit 200 in accordance with anembodiment of the present invention. A signal source 204 generates asignal having a predefined frequency and predefined low 206 (shown inFIG. 4) and high voltage 208 levels (shown in FIG. 4) on a node Vtx 212.

Referring to FIG. 4, in an embodiment of the present invention thesignal is a square wave signal 210 with a rise time and a fall time, hasa fundamental frequency corresponding to the predefined frequency, andthe predefined low voltage level 206 is ground and the predefined highvoltage level 208 is Vdd. Negative voltages and bipolar voltages arealso suitable for the predefined low voltage level 206 and thepredefined high voltage level 208 in the present invention. Embodimentswhere the signal is a square wave signal 210 and the predefined lowvoltage level 206 is ground and the predefined high voltage level 208 isVdd are described below as illustrative examples.

Referring to FIG. 3, a capacitor device under test C_(DUT) 214 iscoupled between node Vtx 212 and a node Vrx 216. The capacitor deviceunder test C_(DUT) 214 couples the charge of Q=C_(DUT)·Vdd orQ=−C_(DUT)·Vdd onto a node Vrx 216 during rising or falling transitions,respectively, of node Vtx 212.

Node Vrx 216 is coupled to an electrical network 218 having at leastfour nodes, (A) 220, (B) 222, (C) 224 and (D) 226. A first switchingmechanism 228 is coupled between nodes (A) 220 and (B) 222. A secondswitching mechanism 230 is coupled between nodes (B) 222 and (C) 224. Athird switching mechanism 232 is coupled between nodes (C) 224 and (D)226. A fourth switching mechanism 234 is coupled between nodes (D) 226and (A) 220. Node (C) 224 is connected to a grounding mechanism 236 forcoupling node (C) 224 to electrical ground.

In an embodiment of the present invention, first switching mechanism228, second switching mechanism 230, third switching mechanism 232 andfourth switching mechanism 234 are switches including NMOS transistors,PMOS transistors and CMOS switches.

The first switching mechanism 228 and the third switching mechanism 232constitute a first pairing controlled by Frect 238 (shown in FIG. 4).The second switching mechanism 230 and the fourth switching mechanism234 constitute a second pairing controlled by {overscore (Frect)} 240(shown in FIG. 4). The first pairing is set to be substantially opened,thereby substantially blocking current, when the second pairing is setto be substantially closed, thereby substantially conducting current.When the first pairing is set to be substantially closed, the secondpairing is set to be substantially opened. By alternating substantiallyopening and substantially closing the first pairing and the secondpairing the transient current 242 (shown in FIG. 4), associated with thecharge Q flowing between Vtx 212 and Vrx 216 in the capacitor deviceunder test C_(DUT) 214, is full-wave rectified.

In one embodiment of the present invention, the first pairingsubstantially blocks current and the second pairing substantiallyconducts current for a predetermined duration of time that includes whenthe signal transitions from ground to Vdd. Furthermore, the firstpairing substantially conducts current and the second pairing issubstantially blocks current for the predetermined duration of time thatincludes when the signal transitions from Vdd to ground. In an alternateembodiment of the present invention, the first pairing substantiallyblocks current and the second pairing substantially conducts current forthe predetermined duration of time that includes when the signaltransitions from Vdd to ground. Furthermore, the first pairingsubstantially conducts current and the second pairing is substantiallyblocks current for the predetermined duration of time that includes whenthe signal transitions from ground to Vdd. In the embodiments, theswitches in the first and second pairing should be switched sufficientlybefore a transition in the signal such that a steady state condition issubstantially obtained. This ensures that switching transients do notsubstantially affect the measurements with the electronic circuit 200.

The predetermined time is substantially greater than a time necessaryfor the transient current 242 to substantially decay. The fundamentalfrequency of the square wave signal 210 is chosen such that each halfperiod or cycle is substantially greater than the time necessary for thetransient current 242 to decay. Note that the time necessary for thetransient current 242 to decay is determined by the RC time constantassociated with the capacitor device under test C_(DUT) 214.

In FIG. 3, a current measuring mechanism 244 is coupled between node (B)222 and node (D) 226 to measure the full-wave rectified transientcurrent 242. In one embodiment of the present invention, the currentmeasuring mechanism 244 is an ammeter. In another embodiment of thepresent invention, the current measuring mechanism 244 is a voltmetercoupled in parallel with an impedance such as a resistor. As was thecase in the prior art electrical circuit shown in FIG. 1, capacitors 246and 248, representing parasitic capacitances due to wiring and deviceparasitics, do not corrupt the capacitance measurement. Rather,capacitors 246 and 248 only slow the signal transitions on nodes Vtx 212and Vrx 216.

FIG. 4 illustrates signal waveforms for the electronic circuit 200 inthe present invention. The square wave signal 210 on node Vtx 212couples positive pulses 250 and negative pulses 252 onto node Vrx 216.Taking the embodiment where the first pairing substantially conductscurrent and the second pairing substantially blocks current for thepredetermined duration of time that includes when the signal transitionsfrom ground to Vdd as an illustrative example, the positive pulses 250on node 216 decay as the charge Q on node Vrx 216 is drained through theelectrical network 218 and the current measuring mechanism 244. Thecharge Q moves through the current measuring mechanism 244 in adirection that causes a positive current measurement. Then, when thefirst pairing substantially conducts blocks current and the secondpairing substantially conducts current for the predetermined duration oftime that includes when the signal transitions from Vdd to ground, thenegative pulses 252 decay as the charge Q on node Vrx 216 is replenishedby the charge Q pulled from the ground mechanism 236 via the currentmeasuring mechanism 244 and the electrical network 218. Since thisarrangement reverses which terminal of the current measuring mechanism244 connects to node Vrx 216 and to the ground mechanism 236, the chargeQ moves through the current measuring mechanism 244 in the directionthat again causes the positive current measurement. Thus the transientcurrent 242 is full-wave rectified.

The capacitance of the capacitor device under test C_(DUT) 214 isdetermined from the measured average current. For the square wave signal210 generated by the signal source 204 with a fundamental frequency f,the average current in the current measuring mechanism 244 is2f·C_(DUT)·Vdd. Therefore, the average current in the current measuringmechanism 244 in this embodiment of the present invention is twice thatof the prior art electronic circuit. This enables more accuratedetermination of the capacitance of the capacitor device under testC_(DUT) 214 as well as determining of a smaller capacitance of thecapacitor device under test C_(DUT) 214.

Amplified Full-Wave Rectifier

FIG. 5 illustrates an electronic circuit 300 in accordance with thepresent invention. A signal source 310 generates a signal having apredefined frequency and predefined low and high voltage levels on anode Vtx 312.

In an embodiment of the present invention, the signal is a square wavesignal with a rise time and a fall time, has a fundamental frequencycorresponding to the predefined frequency, and the predefined lowvoltage level is ground and the predefined high voltage level is Vdd.Negative voltages and bipolar voltage are also suitable for thepredefined low voltage level and the predefined high voltage level inthe present invention. Embodiments where the signal is a square wavesignal and the predefined low voltage level is ground and the predefinedhigh voltage level is Vdd are described below as illustrative examples.

A capacitor device under test C_(DUT) 314 is coupled between node Vtx312 and a node Vrx 316. The capacitor device under test C_(DUT) 314couples the charge of Q=C_(DUT)·Vdd or Q=−C_(DUT)·Vdd onto a node Vrx316 during rising or falling transitions, respectively, of node Vtx 312.

Node Vrx 316 is coupled to a switching mechanism 318 for coupling nodeVrx 316 to a first amplifier 320 or a second amplifier 322. Outputs ofthe first amplifier 320 and the second amplifier are coupled to anoutput node 324 of the electronic circuit 300, wherein output node 324is coupled through ammeter 340 to power supply 324. By coupling node Vrx316 to the first amplifier or the second amplifier a transient currentassociated with the charge Q, flowing between Vtx 312 and Vrx 316 in thecapacitor device under test C_(DUT) 314, is full-wave rectified.

In an embodiment of the present invention, the switching mechanism 318is a switch such as an NMOS transistor, a PMOS transistor and a CMOSswitch.

In one embodiment of the present invention, the switching mechanism 318couples node Vrx 316 to the first amplifier 320 for the predeterminedduration of time that includes when the signal transitions from groundto Vdd, and the switching mechanism 318 couples node Vrx 316 to thesecond amplifier 322 for the predetermined duration of time thatincludes when the signal transitions from Vdd to ground.

In an alternate embodiment of the present invention, the switchingmechanism 318 couples node Vrx 316 to the first amplifier 320 for thepredetermined duration of time that includes when the signal transitionsfrom Vdd to ground, and the switching mechanism 318 couples node Vrx 316to the second amplifier 322 for the predetermined duration of time thatincludes when the signal transitions from ground to Vdd.

The predetermined time is substantially greater than a time necessaryfor the transient current to substantially decay. The fundamentalfrequency of the square wave signal is chosen such that each half periodor cycle is substantially greater than the time necessary for thetransient current to decay. Note that the time necessary for thetransient current to decay is determined by the RC time constantassociated with the capacitor device under test C_(DUT) 314.

In FIG. 5, the first amplifier 320 is an NMOS current mirror 326 with again. The NMOS current mirror 326 is connected to a grounding mechanism328 for coupling the NMOS current mirror 326 to electrical ground. Thesecond amplifier has a PMOS current mirror 330 with unity gain in afirst stage and a NMOS current mirror 332 with substantially the gain ina second stage. The PMOS current mirror 330 is coupled a voltagegenerator 334 for connecting the PMOS current mirror 330 to Vdd. TheNMOS current mirror 332 is connected to a grounding mechanism 328 forcoupling the NMOS current mirror 332 to electrical ground. In anexemplary embodiment, the gain is substantially between 10–100. In theelectronic circuit 300, the switching mechanism 318 couples node Vrx 316to the first amplifier 320 for the predetermined duration of time thatincludes when the signal transitions from ground to Vdd. Transientcurrent flows into node Vrx 316 resulting in an amplified output signalon output node 324. The switching mechanism 318 couples node Vrx 316 tothe second amplifier 322 for the predetermined duration of time thatincludes when the signal transitions from Vdd to ground. Transientcurrent flows out of node Vrx 316. The PMOS current mirror 330 changesthe current direction but not the current magnitude. The NMOS currentmirror 332 substantially duplicates NMOS current mirror 326 resulting inthe amplified output signal on output node 324. In this way, thetransient current is full-wave rectified.

FIG. 5 also illustrates an optional first current biasing mechanism 336coupled in parallel with the first amplifier 320 and an optional secondcurrent biasing mechanism 338 of opposite polarity to the first currentbiasing mechanism 336 coupled in parallel with the second amplifier 322.In FIG. 5, a bias current from the first current biasing mechanism 336is pushed into the first amplifier 320 and a bias current from thesecond current biasing mechanism 338 is pulled from the second amplifier322. In some embodiments, the bias current from the first currentbiasing mechanism 336 and the bias current from the second current biasmechanism 338 are less that a peak of the transient current. The biascurrent improves the transient response of the first amplifier 320 andthe transient response of the second amplifier 322. The bias currentalso allows current to be sourced from the first amplifier 320 into nodeVrx 316 and current to be sunk in the second amplifier 322 from node Vrx316.

In alternate embodiment of the present invention, the first amplifier320 is a PMOS current mirror with the gain. The second amplifier 322 hasa NMOS current mirror with unity gain in a first stage and a PMOScurrent mirror with substantially the gain in a second stage. In anotheralternate embodiment of the present invention, the first amplifier 320has a NMOS current mirror with unity gain in a first stage and a PMOScurrent mirror with the gain in a second stage. The second amplifier 322is a PMOS current mirror with substantially the gain. In yet anotheralternate embodiment of the present invention, the first amplifier 320has a PMOS current mirror with unity gain in a first stage and a NMOScurrent mirror with the gain in a second stage. The second amplifier 322is a NMOS current mirror with substantially the gain.

In FIG. 5, a current measuring mechanism 340 is coupled to the outputnode 324. In one embodiment of the present invention, the currentmeasuring mechanism 340 is an ammeter. In another embodiment of thepresent invention, the current measuring mechanism 340 is a voltmetercoupled in parallel with an impedance such as a resistor. As was thecase in the prior art electrical circuit shown in FIG. 1 and theelectrical circuit 200 in the present invention shown in FIG. 3,capacitors 342 and 344, representing parasitic capacitances due

-   -   to wiring and device parasitics, do not corrupt the capacitance        measurement. Rather, capacitors 342 and 344 only slow the signal        transitions on nodes Vtx 312 and Vrx 316.

The capacitance of the capacitor device under test C_(DUT) 314 isdetermined from the measured average current. For the square wave signalgenerated by the signal source 310 with a fundamental frequency f, theaverage current divided by a gain in the current measuring mechanism 340is 2f·C_(DUT)·Vdd (note that in exemplary embodiments, the gain isbetween 5 and 20). Therefore, the average current divided by the gain inthe current measuring mechanism 340 in this embodiment of the presentinvention is twice that of the prior art electronic circuit. Thisenables more accurate determination of the capacitance of the capacitordevice under test C_(DUT) 314 as well as determining a smallercapacitance of the capacitor device under test C_(DUT) 314.

A method of using the electrical circuit 200 (shown in FIG. 3) and theelectrical circuit 300 (shown in FIG. 5) allows offsets to be eliminatedfrom the determination of the capacitance of the capacitor device undertest C_(DUT) 214 and the capacitor device under test C_(DUT) 314. Aftermaking a first determination of the capacitance using electrical circuit200 or electrical circuit 300, the phase of the signal is changed by180° and a second determination of the capacitance is made. The offsetsare removed by taking the difference between the first determination ofthe capacitance and the second determination of the capacitance anddividing the result by 2.

The foregoing descriptions of embodiments of the present invention havebeen presented for purposes of illustration and description only. Theyare not intended to be exhaustive or to limit the present invention tothe forms disclosed. Accordingly, many modifications and variations willbe apparent to practitioners skilled in the art. Additionally, the abovedisclosure is not intended to limit the present invention. The scope ofthe present invention is defined by the appended claims.

1. An electrical circuit for measuring capacitance, comprising: a signal generating mechanism for generating a signal having a predefined frequency and predefined low and high voltage levels; an electrical network having at least four nodes (A, B, C, D), wherein the network has a first switching mechanism coupled between nodes (A) and (B), a second switching mechanism coupled between nodes (B) and (C), a third switching mechanism coupled between nodes (C) and (D) and a fourth switching mechanism coupled between nodes (D) and (A), and wherein node (C) is connected to a grounding mechanism for coupling node (C) to an electrical ground; and a load having at least two terminals and an unknown capacitance between the terminals, wherein one of the terminals is connected to the signal generating mechanism and another of the terminals is connected to the node (A) in the network, wherein the first switching mechanism and the third switching mechanism constitute a first pairing and the second switching mechanism and the fourth switching mechanism constitute a second pairing, and wherein the first pairing is selectively substantially opened and thereby substantially blocking current while the second pairing is selectively substantially closed and thereby substantially conduct current, and wherein the first pairing is selectively substantially closed while the second pairing is selectively substantially opened in order to full-wave rectify a current flowing between the two terminals in the load.
 2. The electrical circuit of claim 1, further comprising a current measuring mechanism, wherein the current measuring mechanism is coupled to nodes (B) and (D) in the network.
 3. The electrical circuit of claim 2, wherein the current measuring mechanism includes an ammeter.
 4. The electrical circuit of claim 2, wherein the current measuring mechanism includes an impedance with a voltage measuring mechanism coupled in parallel with the impedance.
 5. The electric circuit of claim 4, wherein the impedance includes a resistor.
 6. The electrical circuit of claim 1, wherein the first switching mechanism and the third switching mechanism substantially conduct current and the second switching mechanism and the fourth switching mechanism substantially block current for a first predetermined duration of time that substantially includes when the signal transitions from the low voltage level to the high voltage level; and wherein the first switching mechanism and the third switching mechanism substantially block current and the second switching mechanism and the fourth switching mechanism substantially conduct current for a second predetermined duration of time that substantially includes when the signal transitions from the high voltage level to the low voltage level.
 7. The electrical circuit of claim 1, wherein the first switching mechanism and the third switching mechanism substantially conduct current and the second switching mechanism and the fourth switching mechanism substantially block current for a first predetermined duration of time that substantially includes when the signal transitions from the high voltage level to the low voltage level; and wherein the first switching mechanism and the third switching mechanism substantially block current and the second switching mechanism and the fourth switching mechanism substantially conduct current for a second predetermined duration of time that substantially includes when the signal transitions from the low voltage level to the high voltage level.
 8. The electrical circuit of claim 1, wherein the signal generating mechanism includes mechanism for generating a square wave signal having a rise time and a fall time, the square wave signal having a fundamental frequency equal to the predefined frequency and having the predefined low and high voltage levels.
 9. The electrical circuit of claim 1, wherein the first switching mechanism, the second switching mechanism, the third switching mechanism and the fourth switching mechanism are selected from the group including a NMOS transistor, a PMOS transistor and a CMOS switch.
 10. A method for determining an unknown capacitance, comprising: generating a signal with a signal generating mechanism, wherein the signal has a predefined frequency and predefined low and high voltage levels; applying the signal to an input terminal of a load with at least two terminals, wherein the load has an unknown capacitance between the terminals; detecting signals developed at an output terminal of the load with an electrical network having at least four nodes (A, B, C, D), wherein node (A) is coupled to the output terminal of the load, the network has a first switching mechanism coupled between nodes (A) and (B), a second switching mechanism coupled between nodes (B) and (C), a third switching mechanism coupled between nodes (C) and (D), a fourth switching mechanism coupled between nodes (D) and (A), node (C) in is connected to a grounding mechanism for coupling node (C) to an electrical ground and a current measuring mechanism is coupled to nodes (B) and (D); measuring current with the current measuring mechanism; and calculating the unknown capacitance from the current.
 11. The method of determining an unknown capacitance in claim 10, further comprising: substantially closing the first switching mechanism and the third switching mechanism and substantially opening the second switching mechanism and the fourth switching mechanism for a first predetermined duration of time that substantially includes when the signal transitions from the low voltage level to the high voltage level after generating the signal, applying the signal and detecting the signals, and prior to measuring current.
 12. The method of determining an unknown capacitance in claim 11, further comprising: substantially opening the first switching mechanism and the third switching mechanism and substantially closing the second switching mechanism and the fourth switching mechanism for a second predetermined duration of time that substantially includes when the signal transitions from the high voltage level to the low voltage level; and measuring current with the current measuring mechanism after measuring current and prior to calculating the unknown capacitance from the current.
 13. The method of determining an unknown capacitance in claim 10, further comprising: substantially opening the first switching mechanism and the third switching mechanism and substantially closing the second switching mechanism and the fourth switching mechanism for a first predetermined duration of time that substantially includes when the signal transitions from the low voltage level to the high voltage level after generating the signal, applying the signal and detecting the signals, and prior to measuring current.
 14. The method of determining an unknown capacitance in claim 13, further comprising: substantially closing the first switching mechanism and the third switching mechanism and substantially opening the second switching mechanism and the fourth switching mechanism for a second predetermined duration of time that substantially includes when the signal transitions from the high voltage level to the low voltage level; and measuring current with the current measuring mechanism after measuring current and prior to calculating the unknown capacitance from the current. 